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  5. Volume 2022, Issue 1 (2022)
  6. Diffuse Reflectance of Thin Films with D ...

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Diffuse Reflectance of Thin Films with Defects
Volume 2022, Issue 1 (2022), pp. 243–247
František VIŽĎA  

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https://doi.org/10.47459/cndcgs.2022.31
Pub. online: 31 October 2022      Type: Article      Open accessOpen Access

Published
31 October 2022

Abstract

This paper presents the method of the optical analysis of thin films with defects. The attention is devoted to the defects consisting in boundary roughness. This method is based on interpreting the spectral dependences of the diffuse reflectance of light [1-5]. Thin films are used in the optical and military industries and in military applications, for example for the creation of anti-reflective layers or laser mirrors [6]. The numerical analysis confirms the fundamental influence of the parameters of the defects of thin films on the diffuse reflectance.

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Keywords
diffuse reflectance thin films rough boundaries optical quantities optical analysis

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Generolo Jono Žemaičio Lietuvos karo akademija Šilo g. 5A., LT-10322 Vilnius, el.p: lka@mil.lt

General Jonas Žemaitis Military Academy of Lithuania  Šilo Str. 5A, LT-10322 Vilnius, Lithuania, e-mail: lka@mil.lt

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